MSN 510 Imaging Techniques in Materials Science and Nanotechnology
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Fundamentals of optical microscopy. Introduction to advanced imaging techniques. Details of atomic force microscopy (AFM), scanning tunneling microscopy (STM), transmission electron microscopy (TEM), scanning electron microscopy (SEM), confocal microscopy.
Credit units: 3 ECTS Credit units: 5.
Spring Semester (Bülend Ortaç)
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